Tools for reviewing semiconductor wafer test data: rendering wafer maps, computing yield and spatial statistics, and browsing STDF/ATDF/CSV/JSON/Parquet test results.

📣 What's New — a curated, plain-language timeline of new capabilities across both projects.

Want to look at wafer data? → tsmap

A finished, free, MIT-licensed application. Open STDF, ATDF, CSV, JSON or Parquet (plus .gz/.bz2/.zip) and get interactive yield maps, parametric heat maps, findings, a chart suite, lot galleries and exportable reports — no code, no account, no upload. Native installers for Linux, macOS and Windows, and a no-install browser build where files are still parsed entirely on your own machine. Most people want this one. Open in the browser · Releases · Docs

Building an application? → wafermap — @wafertools/wafermap on npm

The rendering and analysis library tsmap is built on. Interactive wafer map visualisation and yield analysis: hard bins, soft bins, test values, retests, edge exclusion, reticle overlays, spatial statistics, failure clustering and lot-level trend analysis — pure ES modules, no runtime dependencies, no server required. Two calls render a working map.

Reach for it when you need wafer maps inside your own application, a data source tsmap doesn't read, or behaviour it doesn't offer — you can always start with tsmap and integrate later. Docs · Quick Start · npm

Both are written by Paul Robins, who has spent over 30 years building test data analysis software: wafer map and chart viewers, and the platforms they were built on. A lot of that work leaned on free software, and these projects are some of it going back the other way. Both are MIT licensed. More →

Both projects are free, open-source and MIT-licensed. If they save you time, you can support their development on Ko-fi: tips help cover development hardware and running costs. Bug reports and sample files help just as much.

Questions, ideas, or want to show off a wafer map you built? Use GitHub Discussions — open to anyone using either project.